Stress-testing die at wafer level under temperature/voltage to force early-life failures before packaging. AI-die power forces liquid-cooled / high-current burn-in chucks and sockets. Aehr Test Systems is the standalone pure-play proof.
Stress-testing die at wafer level under temperature/voltage to force early-life failures before packaging. AI-die power forces liquid-cooled / high-current burn-in chucks and sockets. Aehr Test Systems is the standalone pure-play proof.