Known-Good-Die (KGD) Test

last updated 2026-06-03
Wafer-Level Test & Burn-In (WLTBI)Wafer-Level Test & …Automated Test Equipment (ATE)Automated Test Equi…Advanced PackagingAdvanced PackagingKnown-Goo…

Screening individual die as good BEFORE they are committed to an expensive multi-die 2.5D/3D package (one bad die scraps a package worth thousands). Made mandatory by chiplet/heterogeneous integration; a binding yield gate for AI-die packaging.

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