Automated Test Equipment (ATE)

last updated 2026-06-03
Wafer Probe Cards & Test Interconnect Wafer Probe Cards &… Known-Good-Die (KGD) Test Known-Good-Die (KGD… Metrology & Testing Metrology & Testing Automated…

Big-iron testers that exercise logic/SoC and memory die at wafer and package level to screen for defects. A qualification-locked duopoly: Advantest + Teradyne hold ~90%+ of SoC/memory ATE. AI/HBM multiplies test insertions (every stacked HBM die adds inserts), making it the fastest-growing back-end equipment line, but value accrues to the incumbents.

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