Wafer Probe Cards & Test Interconnect

last updated 2026-06-03
Automated Test Equipment (ATE)Automated Test Equi…Known-Good-Die (KGD) TestKnown-Good-Die (KGD…Wafer Pro…

The consumable electrical contact between the tester and the wafer at wafer-sort. A FormFactor + Technoprobe duopoly; MEMS/vertical probe cards (~38% of a ~$3.4-3.9B 2025 market) are the defensible, AI-die-driven high-current/fine-pitch segment. Qualification-locked to node/customer.

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